Trends and Volatilities in Heterogeneous Patent Quality in Taiwan

Wen-Cheng Lu; Jong-Rong Chen; I-Hsuan Tung

doi:10.4067/S0718-27242009000200006

Authors

Wen-Cheng Lu National Central University
Jong-Rong Chen National Central University
I-Hsuan Tung National Central University

DOI:

https://doi.org/10.4067/S0718-27242009000200006

Keywords:

patent trends, quality patents, Taiwan.

Abstract

This study analyzes patent trends and volatilities for three heterogeneous quality patents in the Taiwan patent system from January 1973 to June 2006. The estimated models are symmetric GARCH and asymmetric EGARCH, providing full sample, rolling sample, and out-of-sample evidence. Three different patent types exhibit increasing trends, using monthly time series data from our samples. ”New design” patents also show time-varying volatility but other types of patents fail to reject the ARCH LM test. Findings show the asymmetric EGARCH model suitable for “new design” patent type through out of sample forecasts.

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Author Biographies

Wen-Cheng Lu, National Central University

Department of Economics

Jong-Rong Chen, National Central University

National Central University

I-Hsuan Tung, National Central University

National Central University

References

CHAN, R., Marinova, D., McAleer, M. (2004) Trends and Volatilities in Foreign Patents Registered in the USA. Applied Economics, 36, 585-592.

CHAN, R. Marinova, D., McAleer, M. (2004) Modelling the Asymmetric Volatility of Electronics Patents in the USA, Mathematics and computers in Simulation, 64, 169-184.

HALL, B. H. 2004. Innovation and Diffusion, NBER working paer #10212.

HALL, B. H., Jaffe, A., Trajtenberg, M. (2002) The NBER Patent Citations Data File: Lessons, Insights and Methodological Tools, in A. Jaffe and M. Trajtenberg (eds), Patents, Citations and Innovations, Cambridge, MA: The MIT Press.

HALL, B. H., Jaffe, A., Trajtenberg, M. (2005) Market Value and Patent Citations, Rand Journal of Economics, 36, 16-38.

HOTI, S., McAleer, M. (2006) How does Country Risk Rffect Innovation? An Application to Foreign Patents Registered in the USA, Journal of Economic Surveys , 20, 691-714.

GOEL, R. K. (1999) Economic Models of Technological Change: Theory and Application, Quorum Books, Westport, Connecticut, p. 131.

GRILICHES, Z. (1990) Patent Statistics as Economic Indicator: A Survey, Journal of Eonomic Literature, 28, 1661-707.

LING, S., Li, W. K. (1997) On Fractionally Integrated Autoregressive Moving-average Models with Conditional Heterosckedasticity, Journal of the American Statistcal Association, 92, 1184-1194.

LING, S., McAleer, M. (2002a) Necessary and Sufficient Moment Conditions for the GARCH(r,s) Models, Econometric Theory, 18, 722-729.

LING, S., McAleer, M. (2002b) Stationary and the Existence of Moments of a Family of GARCH Processes, Journal of Econometrics, 106, 109-117.

LING, S., McAleer, M. (2003) Asymptotic Theory for a Vector ARMA-GARCH Model, Econometric Theory, 19, 278-308.

MARINOVA, D. (2001) Eastern European Patenting Activities in the USA, Technovation, 21, 571-584.

MARINOVA, D., McAleer, M. (2002) Trends and Volatility in Japanese Patenting in the USA: An Analysis of the Electronics and Transport Industries, Scientometrics , 55, 171-187.

MARINOVA, D., McAleer, M. (2003) Modelling Trends and Volatility in Ecological Patents in the USA, Environmental Modelling and Software, 18, 195-203.

MCALEER, M., Chan, F., Marinova, D. (2007) An Econometric Analysis of Asymmetric Volatility: Theory and Application to Patents, Journal of Econometrics, 139, 259-284.

NELSON D. B. (1991) Conditional Heteroscedasticity in Asset Returns: A New Approach, Econometrica , 59, 347-370.

PATEL, P., Pavitt, K. (1995) Divergence in Technological Development among Countries and Firms, in Technical Change and the World Economy: Convergence and Divergence in Technology Strategies (Ed.) J. Hagedoorn, Edward Elgar, Aldershot, 147-181.

PAVITT, K. (1998) Uses and Abuses of Patent Statistics, in Handbook of Quantitative Studies of Science and Technology (Ed.) A. F. J. van Raan, Elsevier, Amsterdam, 509-536.

SHEPHARD, N. (1996) Statistical Aspects of ARCH and Stochastic Volatility, in: O. E. Barndorff-Nielsen, D. R. Cox, C. V. Hinkley (Eds.), Statistical Models in Econometrics, Finance and Other Fields, Chapman and Hall, London, 1-67.