Journal of Technology Management & Innovation, Vol 3, No 4 (2008)

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The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing

Jun Young Kim, Yongtae Park

Abstract


The relative importance to the particular industry of licensing has not been done enough empirically to pursue the route of the open innovation. That is why the industrial level research on open innovation is more complicated than that of company level. This paper tries to survey industrial level licensing by combining the technology regime theory with NTB(National Technology Bank) score model of KTTC(Korea Technology Transfer Center) and tries to transform Likert score into general value proxy by using information of valuator’s organizations. This paper also introduces two new factors named as ‘patent authorization stage’ for classifying patent status and ‘technology regime based industrial innovation pattern’ for adopting sectoral level research in order to overcome drawbacks of score model in case of application to open innovation licensing.

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